Atom-Probe Field Ion Microscopy (English, Tien T. Tsong)
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Book Details
Publisher
Cambridge University Press
Language
English
ISBN-13
9780521019934
ISBN-10
0521019931
Author
Tien T. Tsong
About the Book
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have b…
ISBN: 9780521019934
ISBN-13: 9780521019934
ISBN-10: 0521019931
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Product ID: isbn-9780521019934
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