Electron Microprobe Analysis and Scanning Electron Microscopy in Geology (English, S. J. B. Reed)
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Book Details
Publisher
Cambridge University Press
Language
English
ISBN-13
9780521848756
ISBN-10
052184875X
Author
S. J. B. Reed
About the Book
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative a…
ISBN: 9780521848756
ISBN-13: 9780521848756
ISBN-10: 052184875X
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Product ID: isbn-9780521848756
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