Nonlinear Transistor Model Parameter Extraction Techniques (English, Matthias Rudolph | Christian Fager | David E. Root)
by Matthias Rudolph | Christian Fager | David E. Root
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Book Details
Publisher
Cambridge University Press
Language
English
ISBN-13
9780521762106
ISBN-10
0521762103
Author
Matthias Rudolph | Christian Fager | David E. Root
About the Book
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied…
ISBN: 9780521762106
ISBN-13: 9780521762106
ISBN-10: 0521762103
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Matthias Rudolph | Christian Fager | David E. Root is the author of Nonlinear Transistor Model Parameter Extraction Techniques. Browse more books by Matthias Rudolph | Christian Fager | David E. Root on BookBajar.
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Product ID: isbn-9780521762106
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