Photo-induced Defects in Semiconductors (English, David Redfield | Richard H. Bube)
by David Redfield | Richard H. Bube
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Book Details
Publisher
Cambridge University Press
Language
English
ISBN-13
9780521461962
ISBN-10
0521461960
Author
David Redfield | Richard H. Bube
About the Book
This book gives a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the authors present properties of DX and EL2 centers in IIISHV compounds. They al…
ISBN: 9780521461962
ISBN-13: 9780521461962
ISBN-10: 0521461960
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Product ID: isbn-9780521461962
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