Reflection Electron Microscopy and Spectroscopy for Surface Analysis (English, Zhong Lin Wang | Wang Zhong Lin)
by Zhong Lin Wang | Wang Zhong Lin
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Book Details
Publisher
Cambridge University Press
Language
English
ISBN-13
9780521017954
ISBN-10
0521017955
Author
Zhong Lin Wang | Wang Zhong Lin
About the Book
This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials sc…
ISBN: 9780521017954
ISBN-13: 9780521017954
ISBN-10: 0521017955
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Product ID: isbn-9780521017954
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