Springer Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces (English, Special Edition, Weronika Walkosz)

About the Book

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β - Si 3 N 4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an impo…

Why You Should Read This Book

• Written by acclaimed author Weronika Walkosz
• Published by Springer, a respected name in academic and professional publishing
• Covers the domain of Materials Science / Ceramics with depth and clarity
• Available in English — ideal for students, researchers, and professionals alike
• A trusted reference work that belongs on every serious reader's shelf

Product Details

This Special Edition of Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces is published by Springer and carries ISBN-13 9781441978165. Packaged securely for delivery across India, this edition is ideal for personal libraries, classroom use, and professional reference.

Who Is This Book For?

Whether you are a student preparing for advanced coursework, a researcher deepening your expertise, or a professional staying current with the field, Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces by Weronika Walkosz is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery available across India.