Springer Built-In-Self-Test and Digital Self-Calibration for RF Socs (English, Special Edition, Sleiman Bou-Sleiman | Mohammed Ismail)

About the Book

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

Why You Should Read This Book

• Written by acclaimed author Sleiman Bou-Sleiman | Mohammed Ismail
• Published by Springer, a respected name in academic and professional publishing
• Covers the domain of Electronics / Circuits / General with depth and clarity
• Available in English — ideal for students, researchers, and professionals alike
• A trusted reference work that belongs on every serious reader's shelf

Product Details

This Special Edition of Built-In-Self-Test and Digital Self-Calibration for RF Socs is published by Springer and carries ISBN-13 9781441995476. Packaged securely for delivery across India, this edition is ideal for personal libraries, classroom use, and professional reference.

Who Is This Book For?

Whether you are a student preparing for advanced coursework, a researcher deepening your expertise, or a professional staying current with the field, Built-In-Self-Test and Digital Self-Calibration for RF Socs by Sleiman Bou-Sleiman | Mohammed Ismail is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery available across India.