Springer Defects in HIgh-k Gate Dielectric Stacks (English, Special Edition, Evgeni Gusev)

About the Book

The goal of this NATO Advanced Research Workshop (ARW) entitled "Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices", which was held in St. Petersburg, Russia, from July 11 to 14, 2005, was to examine the very complex scientific issues that pertain to the use of advanced high dielectric constant (high-k) materials in next generation semiconductor devices. The special feature of this workshop was focus on an important issu…

Why You Should Read This Book

• Written by acclaimed author Evgeni Gusev
• Published by Springer, a respected name in academic and professional publishing
• Covers the domain of Electrical with depth and clarity
• Available in English — ideal for students, researchers, and professionals alike
• A trusted reference work that belongs on every serious reader's shelf

Product Details

This Special Edition of Defects in HIgh-k Gate Dielectric Stacks is published by Springer and carries ISBN-13 9781402043659. Packaged securely for delivery across India, this edition is ideal for personal libraries, classroom use, and professional reference.

Who Is This Book For?

Whether you are a student preparing for advanced coursework, a researcher deepening your expertise, or a professional staying current with the field, Defects in HIgh-k Gate Dielectric Stacks by Evgeni Gusev is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery available across India.