Springer Power-Constrained Testing of VLSI Circuits (English, Special Edition, Nicola Nicolici | Bashir M. Al-Hashimi)

About the Book

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-i…

Why You Should Read This Book

• Written by acclaimed author Nicola Nicolici | Bashir M. Al-Hashimi
• Published by Springer, a respected name in academic and professional publishing
• Covers the domain of Logic Design with depth and clarity
• Available in English — ideal for students, researchers, and professionals alike
• A trusted reference work that belongs on every serious reader's shelf

Product Details

This Special Edition of Power-Constrained Testing of VLSI Circuits is published by Springer and carries ISBN-13 9781402072352. Packaged securely for delivery across India, this edition is ideal for personal libraries, classroom use, and professional reference.

Who Is This Book For?

Whether you are a student preparing for advanced coursework, a researcher deepening your expertise, or a professional staying current with the field, Power-Constrained Testing of VLSI Circuits by Nicola Nicolici | Bashir M. Al-Hashimi is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery available across India.