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Springer Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications (English, Special Edition, César San Martin | Sang-Woon Kim)

by César San Martin | Sang-Woon Kim

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Book Details

Author
César San Martin | Sang-Woon Kim
Publisher
Springer
Language
English
ISBN-13
9783642250842
Format
Special Edition
BISAC
Computer Vision & Pattern Recognition

About the Book

This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucon, Chile, in November 2011. pattern recognition and classification; applications of pattern recognition; and Chilean Workshop

Why You Should Read This Book

  • Written by acclaimed author César San Martin | Sang-Woon Kim
  • Published by Springer, a respected name in academic and professional publishing
  • Covers the domain of Computer Vision & Pattern Recognition with depth and clarity
  • Available in English — ideal for students, researchers, and professionals alike
  • A trusted reference work that belongs on every serious reader's shelf

Product Details

This Special Edition of Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications is published by Springer and carries ISBN-13 9783642250842. Packaged securely for delivery across India, this edition is ideal for personal libraries, classroom use, and professional reference.

Who Is This Book For?

Whether you are a student preparing for advanced coursework, a researcher deepening your expertise, or a professional staying current with the field, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications by César San Martin | Sang-Woon Kim is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery available across India.

ISBN-13: 9783642250842

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Product ID: isbn-9783642250842