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Springer Scanning Probe Microscopy (English, Special Edition, Adam Foster | Werner A. Hofer)

by Adam Foster | Werner A. Hofer

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Book Details

Author
Adam Foster | Werner A. Hofer
Publisher
Springer
Language
English
ISBN-13
9780387400907
Format
Special Edition
BISAC
Electron Microscopes & Microscopy

About the Book

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provid…

Why You Should Read This Book

  • Written by acclaimed author Adam Foster | Werner A. Hofer
  • Published by Springer, a respected name in academic and professional publishing
  • Covers the domain of Electron Microscopes & Microscopy with depth and clarity
  • Available in English — ideal for students, researchers, and professionals alike
  • A trusted reference work that belongs on every serious reader's shelf

Product Details

This Special Edition of Scanning Probe Microscopy is published by Springer and carries ISBN-13 9780387400907. Packaged securely for delivery across India, this edition is ideal for personal libraries, classroom use, and professional reference.

Who Is This Book For?

Whether you are a student preparing for advanced coursework, a researcher deepening your expertise, or a professional staying current with the field, Scanning Probe Microscopy by Adam Foster | Werner A. Hofer is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery available across India.

ISBN-13: 9780387400907

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Product ID: isbn-9780387400907