Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs (English, Ruijing Shen | Sheldon X. -D Tan | Hao Yu)
by Ruijing Shen | Sheldon X. -D Tan | Hao Yu
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Book Details
Publisher
Springer
Language
English
ISBN-13
9781461407874
ISBN-10
1461407877
Author
Ruijing Shen | Sheldon X. -D Tan | Hao Yu
About the Book
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the pr…
ISBN: 9781461407874
ISBN-13: 9781461407874
ISBN-10: 1461407877
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Product ID: isbn-9781461407874
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